AFM (Atomic Force Microscopy)
| AFM (Atomic Force Microscope – Veeco) is a high resolution scanning probe microscope that enables looking at rubbing and other surfaces at the nanoscale. |
AFM Testing · Surface investigation of rubbed and un- rubbed tribological surfaces · Topography and lateral force imaging of additive films · Surface characterisation of thin films and coatings
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AFM Test Examples in pdf format
AFM Surface Images